Nowak, Regina-Elisabeth (2011) Investigation of opto-electronical properties of DC magnetron sputtered ZnO:Al films with respect to the layer thickness, annealing temperature and resistance inhomogeneity. Masters, Universität Oldenburg.
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Abstract
Investigation of opto-electronical properties of DC magnetron sputtered ZnO:Al films with respect to the layer thickness, annealing temperature and resistance inhomogeneity
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Untersuchung der opto-elektronischen Eigenschaften von DC gesputterten ZnO:Al-Schichten im Hinblick auf die Schichtdicke, Nachbehandlungstemperatur und Widerstandsinhomogenität
| Item Type: | Thesis (Masters) |
|---|---|
| Uncontrolled Keywords: | [Keine Schlagwörter von Autor/in vergeben.] |
| Controlled Keywords: | Physik |
| Subjects: | Science and mathematics > Physics |
| Divisions: | Faculty of Mathematics and Science |
| Date Deposited: | 17 Jan 2013 14:27 |
| Last Modified: | 08 Jul 2013 13:04 |
| URI: | https://oops.uni-oldenburg.de/id/eprint/1218 |
| URN: | urn:nbn:de:gbv:715-oops-12971 |
| DOI: | |
| Nutzungslizenz: |
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