Demircioğlu, Özden and Salas, José Fabio López and Rey, Germain and Weiss, Thomas and Mousel, Marina and Redinger, Alex and Siebentritt, Susanne and Parisi, Jürgen and Gütay, Levent (2017) Optical properties of Cu_2ZnSnSe_4 thin films and identification of secondary phases by spectroscopic ellipsometry. Optics express, 25 (5). pp. 5327-5340. ISSN 1094-4087

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We apply spectroscopic ellipsometry (SE) to identify secondary phases in Cu2ZnSnSe4 (CZTSe) absorbers and to investigate the optical properties of CZTSe. A detailed optical model is used to extract the optical parameters, such as refractive index and extinction coefficient in order to extrapolate the band gap values of CZTSe samples, and to obtain information about the presence of secondary phases at the front and back sides of the samples. We show that SE can be used as a non-destructive method for detection of the secondary phases ZnSe and MoSe2 and to extrapolate the band gap values of CZTSe phase.

Item Type: Article
Additional Information: Publiziert mit Hilfe des DFG-geförderten Open Access-Publikationsfonds der Carl von Ossietzky Universität Oldenburg.
Subjects: Science and mathematics > Physics
Divisions: Faculty of Mathematics and Science > Institute of Physics (IfP)
Date Deposited: 26 Sep 2017 11:37
Last Modified: 22 Nov 2017 11:47
URN: urn:nbn:de:gbv:715-oops-33967
DOI: 10.1364/OE.25.005327

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